Anomalies in Thin Films
An anomaly in a thin film will disturb the phase of a light wave passing through it. Normal cameras only register the amplitude of the reflected light but are insensitive …
An anomaly in a thin film will disturb the phase of a light wave passing through it. Normal cameras only register the amplitude of the reflected light but are insensitive …
Glass substrates are emerging as an important platform for advanced packaging and redistribution layers, driven by their combination of low coefficient of thermal expansion, excellent surface flatness, and low dielectric …
Wafer level packaging (WLP) pushes interconnect density and form factor to their limits, but it also pushes metrology to its limits. Inspection of bump height, redistribution layer (RDL) step heights, …
Wafer bonding is a critical process step in advanced semiconductor manufacturing. It is used to join two wafers face-to-face to create stacked structures for 3D integration, MEMS packaging, power devices, …
Thin film layers are the foundation of every modern semiconductor device. Controlling the thickness and uniformity of these films across the entire wafer is critical because even nanometre-scale variations translate …
lineWLI’s measurement capabilities go beyond just height information. The device can also measure the thickness of transparent thin films. This posts revisits a sample from a previous post. In the …
11:22 AM Wafer dicing is the process of separating a finished semiconductor wafer into individual dies. While it appears straightforward compared to the complexity of front-end fabrication, it is a …
Dry etching is one of the most critical process steps in semiconductor fabrication, used to transfer circuit patterns from photoresist into the underlying material layers such as silicon dioxide, silicon …
Backgrinding reduces silicon wafers to the thickness required for advanced packaging. However, the grinding process leaves a damaged surface layer whose roughness directly determines die strength, downstream bonding yield, and …
Sample: A polka dot beam splitter (Thorlabs’ BPD254-FS) consists of 100 µm large metallic squares on top of a glass substrate. lineWLI technology measures the profile of one line in …
